A parallel virtual instrumentation framework for improving diagnostic efficiency in bed-of-nails testers

Abstract

Conventional sequential PCB testers are inefficient, as a single failure halts all subsequent tests, leading to incomplete diagnostic data and delayed fault isolation. This study proposes a parallel virtual instrumentation framework in LabVIEW to overcome these limitations. By leveraging asynchronous execution, the framework runs multiple independent tests concurrently, continuing to acquire data from unaffected circuits even when a subsystem fails. This parallel approach shortens test duration, enhances fault coverage, and improves diagnostic completeness. The proposed method aims to maximize resource use and facilitate better decision-making in automated electronic testing environments.